About the Author
Vladimir S. Zajic obtained a MS in Physics in 1976 and a Ph.D. in Nuclear Physics in 1983, both from the Charles University of Prague in the Czech Republic. In 1986, he immigrated to the United States as a refugee. After some initial struggle with the language, he joined the Brookhaven National Laboratory in 1988 and became involved in radiation testing of electronic devices used in communication satellites, for military applications, and in space exploration (enlarge photos 1 and 2). He published several scientific articles on radioactivity measurements and radiation testing of electronic devices in leading scientific journals, such as the International Journal of Applied Radiation and Isotopes, Nuclear Instruments and Methods, and the IEEE Transactions on Nuclear Science.